Kendiliğinden Kanal Oluşturmalı Karbon Tabanlı Memristörler İçin DC Dirençlerini Okuyarak Yapılan Bir Sağlamlık Testinin Güvenilirliğinin İncelenmesi

Year 2023, Volume: 11 Issue: 4, 1715 - 1724, 24.10.2023

Ceylan Dalmış Ercan , Ertuğrul Karakulak , Reşat Mutlu

https://doi.org/10.29130/dubited.1084460

Abstract

Neredeyse yarım yüzyıl önce varlığı teorik olarak tahmin edilen ideal memristör, doğrusal olmayan ve güç tüketen bir devre elemanıdır. Günümüzde, ideal memristör olmayan ince filmler gibi memristif sistemler de memristör olarak isimlendirilmektedir. Bu tür sistemler akıma bağlı davranışa ve doğrusal olmayan yüke bağlı elektrik direncine sahiptir. Kendiliğinden kanal oluşturmalı (KKO) Karbon, Tungsten, Krom ve Kalay tabanlı memristörler günümüzde ticari olarak temin edilebilir hale gelmiştir ve araştırma amacıyla kullanılmaktadır. Tüm devre elemanları kullanılmadan önce test edilmelidir. Gelecekte memristörlerin elektronik devrelerde yaygınca kullanılması beklenmektedir. Bununla birlikte, literatürde rapor edilmiş az sayıda memristör testi mevcuttur. Bildiğimiz kadarıyla, literatürde Kendiliğinden Kanal Oluşturmalı Karbon Tabanlı memristörler için önerilmiş bir sağlamlık testi yoktur. Bu çalışmada yakın zamanda önerilen sadece bir multimetre kullanılarak yapılabilen bir memristör sağlamlık testi bir seri direnç kullanılarak modifiye edilmiştir. Bu test Kendiliğinden Kanal Oluşturmalı Karbon Tabanlı memristörler üzerinde denenmiştir. Ne yazık ki, bu test Kendiliğinden Kanal Oluşturmalı Karbon Tabanlı memristörler için güvenilmez ve geçersiz bulunmuştur.

Keywords

Memristör, Eleman testi, Knowm memristörler, Karbon tabanlı memristörler

Examination of the Reliability of a Robustness Test for the Self-Directed Channel Carbon-Based Memristors by Reading Their DC Resistance

Abstract

An ideal memristor that has been theoretically predicted almost a half-century ago is a nonlinear power dissipating circuit element. Nowadays, memristive systems such as thin films which are not ideal memristors are also called memristors. Such systems have current-dependent behavior and nonlinear charge-dependent electrical resistance. Self-directed channel Carbon-, Tungsten-, Chrome-, and Tin-based memristors have become commercially available nowadays and they are used for research purposes. All circuit components must be tested before their usage. It is expected that memristors will become commonly used in electronic circuits in the future. However, the literature has just a few memristor tests reported. To the best of our knowledge, there is not a suggested robustness test for the self-directed channel Carbon-based memristors in the literature. In this study, A recently suggested memristor robustness test which could be made using just a multimeter is modified using a series resistor. The test is tried on the Self-Directed Channel Carbon-Based memristors. Unfortunately, the test is found unreliable and invalid for the self-Directed Channel Carbon-Based memristors.

Keywords

Memristor, Component test, Knowm memristors, Carbon-based memristors

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