A Simple Test for Non-ideal Memristors

Year 2019, Volume: 2 Issue: 1, 1 - 5, 18.07.2019

Reşat Mutlu , Ertuğrul Karakulak

Abstract

Semiconductor components must be tested before
their usage. The test for a diode is well-known. Memristor is a nonlinear
circuit element, whose existence has been predicted in 1971 and a memristive
system behaving as memristor has been found in 2008. It is actually a nonlinear
resistor with charge-dependency. In recent years, memristor has become an
important research area. In addition to ideal memristors, memristive systems
are nowadays also called memristors. However, memristor is not entirely known
as a circuit element and there is still research undergoing to model it.
Memristor has different models used in literature, such as linear dopant drift
models, nonlinear dopant drift models, and threshold-based models. If memristor
would become commercially available and start being commonly used in circuits,
it will also need testing methods to be used by circuit designers. In this
paper, by reviewing some of the memristor models given in literature, a simple
test is suggested to be applied for individual memristors.   

Keywords

Memristor, Component test, Thin films

Yüksek Roff/Ron Oranlı Memristörler İçin Bir Test Yöntemi

Abstract

Yarı iletken elektronik elemanlar kullanımlarından önce test
edilmelidirler. Memristörler varlığı 1971 yılında ortaya atılmış olan doğrusal
olmayan elemanlardır ve bir memristif sistem 2008 yılında bulunmuştur.
Memristörler son yıllarda önemli bir araştırma alanına dönüşmüştür. Ayrıca
memristörlere ilave olarak memristif sistemler de memristör olarak
adlandırılmaktadır. Literatürde memristörlere ait lineer iyon sürüklenme hızlı,
doğrusal olmayan iyon sürüklenme hızlı ve eşik voltajlı olmak üzere çok sayıda model
bulunmaktadır. Bir gün memristörler ticari olarak satıldığında devre
tasarımcılarının bir memristör test yöntemine ihtiyaç olacaktır. Bu makalede
öncelikle çeşitli memristör modelleri incelenmiş ve yüksek R_OFF/R_ON oranına sahip memristörler için bir test yöntemi verilmiştir. Bu test sadece
bir multimetre ya da ohmmetre kullanılarak yapılabilmekte ve ölçülen
memristörün sağlam ya da bozuk olduğunu göstermektedir.

Keywords

Memristör, Eleman test, İnce filmler.

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