Capacitive Measurement Circuit Design for Yarn Unevenness Analysis: Mathematical Approach and Realization

Year 2020, Volume: 24 Issue: 1, 5 - 11, 20.04.2020

Koray Gurkan

https://doi.org/10.19113/sdufenbed.541139

Abstract

Textile
sector has become a rapidly growing export sector constitutes a large part of
Turkey. In order to compete with the foreign market, product quality needs to
be increased. Product quality may vary depending on yarn quality. In this
study, a new measurement circuit based on the differential parallel plate
method was proposed and analyzed mathematically for the capacitive measurement
of yarn unevenness, which is one of the parameters that determine the yarn
quality. The design steps of the parallel plates and the analog circuit, their
implementation, the experimental setup are explained and the measurement results
are given. With the designed circuit, the yarn unevenness measurement was
carried out very precisely.

Keywords

Analog circuit design, Capacitive measurement, Sensor, Yarn unevenness

İplik Düzgünsüzlük Analizi için Kapasitif Ölçüm Devresi Tasarımı: Matematiksel Yaklaşım ve Gerçekleme

Abstract

Tekstil sektörü, hızla gelişen ve Türkiye ihracatının büyük kısmını oluşturan bir sektör haline gelmiştir. Tekstil ürünlerinin dış piyasa ile rekabet edebilmesi için ürün kalitesinin artması gerekmektedir. Ürün kalitesi ise iplik kalitesine bağlı olarak değişebilmektedir. Bu çalışmada iplik kalitesini belirleyen parametrelerden biri olan iplik düzgünsüzlüğünün kapasitif olarak ölçümü için farksal paralel plaka yöntemine dayanan yeni bir ölçüm devresi önerisi yapılmış ve matematiksel olarak analiz edilmiştir. Paralel plakaların ve analog devrenin tasarım adımları, gerçeklenmesi, deney düzeneği anlatılmış ve ölçüm sonuçları irdelenmiştir. Tasarlanan devre ile düzgünsüzlük ölçümü oldukça hassas şekilde gerçekleştirilmiştir.

Keywords

Analog devre tasarımı, Kapasitif ölçüm, Sensör, İplik düzgünsüzlük

References

• [1] Goswami, B.C., Martindale, J.G., Scardino, F.L. 1977. Textile Yarns: Technology, Structure and Applications. John Wiley and Sons. New York, 482s.
• [2] Gries, T. and Veit, D. Wulfhorst, B. 2015. Textile Technology: An Introduction. Carl Hanser Verlag GmbH & Co. KG, 457s.
• [3] Nancy K. Clive, K. Slater. 1974. Simulation of the Electric Field in Evenness-Testing Capacitors, The Journal of The Textile Institute, 65(8), 397-401.
• [4] Carvalho, V., Pinto, J. G., Monteiro, J., Vasconcelos, R. M., Soares, F. O. 2003. On-line measurement of yarn evenness. IEEE International Symposium on Industrial Electronics, 9-11 Haziran, Brezilya, 1059-1064.
• [5] Pinto, J. G., Carvalho, V., Monteiro, J. L., Vasconcelos, R. M., Soares, F. O. 2007. Yarn-mass Measurement with 1-mm-length Samples. IEEE Transactions on Industrial Electronics, 54(2), 1177-1183.
• [6] Gang, Y., Entao, Y., Shencun, H., Ning, J. 2016. The research on High Sensitivity and Anti-saturation of Capacitance Sensors for Measuring Yarn Evenness. 10th International Conference on Sensing Technology (ICST), 11-13 Kasım, Çin, 1-6.
• [7] Hoffmann, D. 1973. Measuring Capacitor. United States Patent, US3754172A, 1-4.
• [8] Geiter, P., Rolf, J. 1999. Methode and Device for Measuring the Solid Proportion of a Material Under Test. European Patent Office, EP0924513A1, 1-10.
• [9] Ott, P., Schmid, P. 2008. Device and Method for Examining a Solid, Elongate Product to be Tested. United States Patent, US20080111563A1, 1-11.
• [10] Gehrig, R., Phillipp, O., Rolf, J. 2014. Capacitive Measuring Circuit for Yarn Inspection. United States Patent, 8698510, 1-10.
• [11] Peters, G., Vries, L. D., Storz, R. 2016. Electrode Assembly for Capacitively Testing an Elongated Textile Material. World Intellectual Property Organization, WO2016149842A1, 1-21.
• [12] Carvalho, V., Cardoso, P., Belsley, M., Vasconcelos, R. M., Soares, F. O. 2006. Development of a Yarn Evenness Measurement and Hairiness Analysis System. 32nd Annual Conference on IEEE Industrial Electronics, 6-10 Kasım, Fransa, 3621-3626.
• [13] Carvalho, V. H., Belsley, M. S., Vasconcelos, R. M., Soares, F. O. 2009. Automatic Yarn Characterization System: Design of a Prototype. IEEE Sensors Journal, 9(8), 987-993.
• [14] Carvalho, V., Belsley, M., Vasconcelos, R., Soares, F. 2011. A comparison of Mass Parameters Determination Using Capacitive and Optical Sensors. Sensors and Actuators A: Physical, 167(2), 327-331.
• [15] Sparavigna, A., Broglia, E., Lugli, S. 2004. Beyond Capacitive Systems with Optical Measurements for Yarn Evenness Evaluation. Mechatronics, 14(10), 1183-1196.
• [16] Ozkaya, Y. A., Acar, M., Jackson, M. 2005. Digital Image Processing and Illumination Techniques for Yarn Characterization. Journal of Electronic Imaging, 14(2), 023001, 1-13.
• [17] Sengupta, A., Roy, S., & Sengupta, S. 2015. Development of a Low Cost Yarn Parameterisation Unit by Image Processing. Measurement, 59, 96-109.
• [18] Li, G., Akankwasa, N. T., Zhao, Q., & Wang, J. 2019. A Novel System for Yarn Cross-Section Analysis Based on Dual Orthogonal CCD Sensors. Journal of Natural Fibers, 16(1), 114-125.
• [19] Analog Devices. 2019. http://www.analog.com (Erişim Tarihi: 28.02.2019).