In
this study, ZnO films were produced by hydrothermal synthesis onto glass
substrates. The structural properties of ZnO films were examined using X-ray
diffraction (XRD) techniques. According to XRD results, the high quality
polycrystalline ZnO films were achieved at low temperature. Spectroscopic
ellipsometry (SE) technique and Cauchy-Urbach model were used to the important
optic constants of films as the thickness (d),
refractive index (n) and extinction
coefficient (k). The transmittance,
absorbance and reflectance spectra of films were obtained by Uv-vis
spectrophotometer and optical properties were analyzed using these spectra.
Also, the surface properties, roughness and electrical resistivity values were
investigated by atomic force microscopy (AFM), field emission scanning electron
microscopy (FESEM) and four-probe technique, respectively. Finally, the
characterization results of ZnO films showed that, hydrothermal synthesis
allowed production of ZnO films which higher quality than other techniques at
low temperature.
Subjects | Engineering |
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Journal Section | Articles |
Authors | |
Publication Date | December 1, 2016 |
Published in Issue | Year 2016 Volume: 17 Issue: 4 |