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Yıl 2014, Cilt: 27 Sayı: 1, 627 - 636, 28.03.2014

Öz

Kaynakça

  • He, G., Zhu, L.Q., Liu, M., Fang, Q., Zhang, L.D., Appl. Surf. Sci., 253, 3413(2007).
  • Aarik, J., Ma¨ndar, H., Kirm, M., Pung, L., Thin Solid Films, 466, 41, (2004).
  • Renault, O., Rarrett, N.T., Samour, D., Quiais- Marthon, S., Surf. Sci., 526: 566–568 (2004).
  • Zhao, X.Y., Vanderbilt, D., Phys. Rev. B, 65: 233106(2002).
  • Terki, R., Feraoun, H., Bertrand, G., Aourag, H., Comput. Mater. Sci., 33: 44(2005).
  • Cockayne, E., Phys. Rev. B 75, 094103 (2007).
  • Weir, B.E., Silverman, P.J., . Alam, M.A, Baumann, F., Monroe, D., Ghetti, A., Bude, J.D., Timp, G.L., Hamad, A., Oberdick, T.M., Zhao, N.X., Ma, Y., Brown, M.M., Hwang, D., Sorsch, T.W., IEDM Tech. Dig., 437 (1999).
  • Cao, M., Vande Voorde, P., Cox, M, Greene, W., IEEE Electron Device Lett., 19: 291 (1998).
  • Fleming, W.J., J. Electrochem. Soc., 21: 124(1977).
  • Alcock, C.B., Mater. Sci. Res., 419:10 (1975).
  • Waldorf, A.J., Dobrowolsk, J.A.I, Sullivan, B.T., Plante, L.M., Appl. Opt., 5583: 32(1993).
  • Wilk, G.D., Wallace, R.M., Anthony, J.M., J. Appl. Phys., 5243: 89(2001).
  • Terki, R., Bertrand, G., Aourag, H., Coddet, C., Mater. Lett. ,62: 1484 (2008).
  • Boyer, L.L., Klein, B.M., J. Am. Ceram. Soc., 278 : 68 (1985).
  • Cohen, R.E., Mehl, M.J., Boyer, L.L., Physica B 1, 150 (1988).
  • Jansen, H.J.F., Gardner, J.A., Physica B, 10: 150 (1988).
  • Jansen, H.J.F., Phys. Rev. B, 7267, 43(1991).
  • Jomard, G., Petit, Pasturel, T. A., Magaud, L., Kresse, G., Hafner, J., Phys. Rev. B, 4044 59 (1999).
  • Stapper, G., Bernasconi, M., Nicoloso, N., Parrinello, M., Phys. Rev. B,797, 59(1999).
  • Fabris, S., Paxton, A.T., Finnis, M.W., Phys. Rev. B 6617, 61(2000).
  • Foster, A.S., Sulimov, V.B., Lopez Gejo, F., Shluger, A.L., Nieminen, R.M., Phys. Rev. B 224108-1, 64 (2001).
  • Dabrowski, J., Zavodinsky, V., Fleszar, A., Microelectron. Reliab. 1093, 41(2001).
  • Foster, A.S., Shluger, A.l., Nieminen, R.M., Phys. Rev. Lett., 225901-1, 89 (2002).
  • Lin, W., Kang, J., Zhu, Z., Mater. Sci. Eng. B, 553: 99(2003).
  • Foster, A.S., Lopez Gejo, F., Shluger, A.L., Nieminen, R.M., Phys. Rev. B, 174117-1, 65 (2002).
  • Caravaca, M.A., Casali, R.A., J. Phys.: Condens. Matter, 17: 5795 (2005).
  • Rignanese, G.M., Gonze, X., Jun, G, Cho, K., Pasquarello, A., Phys. Rev. B, 69:184301 (2004).
  • Atashi, B.M., Javier, F.S., Charles, B.M., Phys. Rev. B, 73: 115330(2006).
  • Patil, S.K.R., Wang, Y.X., Phys. Stat. Sol. B, 247: 54 (2010).
  • Liu, Q. et al., Physica B, 404: 3614–3619 (2009).
  • Liu, Q.J., Liu, Z.T., Feng, L., Xu, B., Physica Stat. Solidi B, 248: 4950 (2011).
  • Liu, Q.J., Liu, Z.T., Feng, L., Commun. Theor. Phys., 56: 779(2011).
  • Zhu, J.B., Ren, H.S., Zhu, J., Hao, Y. J., Liu, J., Zhang, C. M., Long, X.J., Physica B, 406: 2501, (2011).
  • Dudarev, S.L., Botton, G.A., Savrasov, S.Y., Humphreys, C.J., Sutton, A.P., Phys. Rev.B, 57: 1505(1998).
  • Kresse, G., Hafner, J., Phys. Rev. B, 48 : 13115(1993). [36] Kohn, W., Sham, L.J., Phys. Rev., 140, A1133(1965).
  • Wang, Y., Perdew, J.P., Phys. Rev. B, 44: 13298 (1991).
  • Bl¨ochl, P. E., Phys. Rev. B , 50: 17953 (1994).
  • Monkhorst, H. J., Pack, J.D., Phys. Rev. B, 13: 5188 (1976).
  • Stacy, D.W., Johnstone, J.K., Wilder ,D.R., J. Am. Ceram. Soc., 55 (1972).
  • Murnaghan, F. D., Proc. Natl., Acad. Sci., USA : 30, 5390 (1994)
  • Demkov, A.A., Phys.Stat.Sol. B, 226, No.1 (2001)
  • Wang, J., Li, H.P., Stevens, R., J. Of Mat. Sci., 27: 5397(1992)
  • He, G. et al., Appl. Surf. Sci., 253 (2007)
  • Medvedeva, N.I., Zhukovi, V.P., Khodos, M.Y., Gubanov, V.A., Phys. Status. Sol., 160: 517 (1990)
  • Nielson, O. H., Martin, R.M., Phys. Rev. Lett., 50, 697 (1983).
  • Mayer, V.B., Anton, H., Bott, E., Methfessel, M., Sticht, J., Haris, J., Schmidt, P. C., Intermetallics 11, 23 (2003).
  • Sevik, C., Çağın, T., Phys. Rev. B, 80, 014108(2009)
  • Young, A. F., Sanloup, C., Gregoryanz, E., Scandolo, S., Hemley, R. E., Mao, H. K., Phys. Rev. Lett.,96: 155501(2006).
  • Watt, J.P., Peselnick, L., J.App. Phys., 51: 1525 (1980).
  • http://chianti.geol.ucl.ac.uk/~dario/ (1998).
  • Alfè, D., Price, G. D., Gillan, M. J., Phys. Rev. B: 64, 045123 (2001).
  • Kresse, G., Furthmüller, J. and Hafner, J., Europhys. Lett., 32: 729 (1995).

First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter

Yıl 2014, Cilt: 27 Sayı: 1, 627 - 636, 28.03.2014

Öz

We have performed first-principles calculations of the structural, electronic, mechanical, and vibrational properties of HfO2 based on the density functional theory with Local Density Approximation (LDA), Generalized Gradient Approximation(GGA), the LDA + U and GGA+U approaches based on the density functional theory (DFT). In orderd to describe precisely the strong on-site Coulomb repulsion among the localized Hf 5d electrons, we adopt the LDA+U and GGA+U formalism for the exchange correlation term. For the total-energy calculation we have used the projected augmented plane-wave (PAW) implementation of the Vienna Ab initio Simulation Package (VASP). The dependence of selected properties of this material on the effective U parameter has been investigated in detail. We have used to examine structure parameter in Fluorite(C1) structure of HfO2. The equilibrium geometries, the total and partial densities of states, elastic constants, elastic moduli, Poisson’s ratio, Zener anisotropy factor, Young’s modulus and shear modulus and phonon dispersion curves for this material are systematically investigated and analyzed in comparison with experiments and previous calculations. We show for the first time that the addition of an on-site Hubbard repulsion term to the LDA and GGA leads to improved agreement between calculated and experimental values of structural and electronic properties, except for elastic properties.

Kaynakça

  • He, G., Zhu, L.Q., Liu, M., Fang, Q., Zhang, L.D., Appl. Surf. Sci., 253, 3413(2007).
  • Aarik, J., Ma¨ndar, H., Kirm, M., Pung, L., Thin Solid Films, 466, 41, (2004).
  • Renault, O., Rarrett, N.T., Samour, D., Quiais- Marthon, S., Surf. Sci., 526: 566–568 (2004).
  • Zhao, X.Y., Vanderbilt, D., Phys. Rev. B, 65: 233106(2002).
  • Terki, R., Feraoun, H., Bertrand, G., Aourag, H., Comput. Mater. Sci., 33: 44(2005).
  • Cockayne, E., Phys. Rev. B 75, 094103 (2007).
  • Weir, B.E., Silverman, P.J., . Alam, M.A, Baumann, F., Monroe, D., Ghetti, A., Bude, J.D., Timp, G.L., Hamad, A., Oberdick, T.M., Zhao, N.X., Ma, Y., Brown, M.M., Hwang, D., Sorsch, T.W., IEDM Tech. Dig., 437 (1999).
  • Cao, M., Vande Voorde, P., Cox, M, Greene, W., IEEE Electron Device Lett., 19: 291 (1998).
  • Fleming, W.J., J. Electrochem. Soc., 21: 124(1977).
  • Alcock, C.B., Mater. Sci. Res., 419:10 (1975).
  • Waldorf, A.J., Dobrowolsk, J.A.I, Sullivan, B.T., Plante, L.M., Appl. Opt., 5583: 32(1993).
  • Wilk, G.D., Wallace, R.M., Anthony, J.M., J. Appl. Phys., 5243: 89(2001).
  • Terki, R., Bertrand, G., Aourag, H., Coddet, C., Mater. Lett. ,62: 1484 (2008).
  • Boyer, L.L., Klein, B.M., J. Am. Ceram. Soc., 278 : 68 (1985).
  • Cohen, R.E., Mehl, M.J., Boyer, L.L., Physica B 1, 150 (1988).
  • Jansen, H.J.F., Gardner, J.A., Physica B, 10: 150 (1988).
  • Jansen, H.J.F., Phys. Rev. B, 7267, 43(1991).
  • Jomard, G., Petit, Pasturel, T. A., Magaud, L., Kresse, G., Hafner, J., Phys. Rev. B, 4044 59 (1999).
  • Stapper, G., Bernasconi, M., Nicoloso, N., Parrinello, M., Phys. Rev. B,797, 59(1999).
  • Fabris, S., Paxton, A.T., Finnis, M.W., Phys. Rev. B 6617, 61(2000).
  • Foster, A.S., Sulimov, V.B., Lopez Gejo, F., Shluger, A.L., Nieminen, R.M., Phys. Rev. B 224108-1, 64 (2001).
  • Dabrowski, J., Zavodinsky, V., Fleszar, A., Microelectron. Reliab. 1093, 41(2001).
  • Foster, A.S., Shluger, A.l., Nieminen, R.M., Phys. Rev. Lett., 225901-1, 89 (2002).
  • Lin, W., Kang, J., Zhu, Z., Mater. Sci. Eng. B, 553: 99(2003).
  • Foster, A.S., Lopez Gejo, F., Shluger, A.L., Nieminen, R.M., Phys. Rev. B, 174117-1, 65 (2002).
  • Caravaca, M.A., Casali, R.A., J. Phys.: Condens. Matter, 17: 5795 (2005).
  • Rignanese, G.M., Gonze, X., Jun, G, Cho, K., Pasquarello, A., Phys. Rev. B, 69:184301 (2004).
  • Atashi, B.M., Javier, F.S., Charles, B.M., Phys. Rev. B, 73: 115330(2006).
  • Patil, S.K.R., Wang, Y.X., Phys. Stat. Sol. B, 247: 54 (2010).
  • Liu, Q. et al., Physica B, 404: 3614–3619 (2009).
  • Liu, Q.J., Liu, Z.T., Feng, L., Xu, B., Physica Stat. Solidi B, 248: 4950 (2011).
  • Liu, Q.J., Liu, Z.T., Feng, L., Commun. Theor. Phys., 56: 779(2011).
  • Zhu, J.B., Ren, H.S., Zhu, J., Hao, Y. J., Liu, J., Zhang, C. M., Long, X.J., Physica B, 406: 2501, (2011).
  • Dudarev, S.L., Botton, G.A., Savrasov, S.Y., Humphreys, C.J., Sutton, A.P., Phys. Rev.B, 57: 1505(1998).
  • Kresse, G., Hafner, J., Phys. Rev. B, 48 : 13115(1993). [36] Kohn, W., Sham, L.J., Phys. Rev., 140, A1133(1965).
  • Wang, Y., Perdew, J.P., Phys. Rev. B, 44: 13298 (1991).
  • Bl¨ochl, P. E., Phys. Rev. B , 50: 17953 (1994).
  • Monkhorst, H. J., Pack, J.D., Phys. Rev. B, 13: 5188 (1976).
  • Stacy, D.W., Johnstone, J.K., Wilder ,D.R., J. Am. Ceram. Soc., 55 (1972).
  • Murnaghan, F. D., Proc. Natl., Acad. Sci., USA : 30, 5390 (1994)
  • Demkov, A.A., Phys.Stat.Sol. B, 226, No.1 (2001)
  • Wang, J., Li, H.P., Stevens, R., J. Of Mat. Sci., 27: 5397(1992)
  • He, G. et al., Appl. Surf. Sci., 253 (2007)
  • Medvedeva, N.I., Zhukovi, V.P., Khodos, M.Y., Gubanov, V.A., Phys. Status. Sol., 160: 517 (1990)
  • Nielson, O. H., Martin, R.M., Phys. Rev. Lett., 50, 697 (1983).
  • Mayer, V.B., Anton, H., Bott, E., Methfessel, M., Sticht, J., Haris, J., Schmidt, P. C., Intermetallics 11, 23 (2003).
  • Sevik, C., Çağın, T., Phys. Rev. B, 80, 014108(2009)
  • Young, A. F., Sanloup, C., Gregoryanz, E., Scandolo, S., Hemley, R. E., Mao, H. K., Phys. Rev. Lett.,96: 155501(2006).
  • Watt, J.P., Peselnick, L., J.App. Phys., 51: 1525 (1980).
  • http://chianti.geol.ucl.ac.uk/~dario/ (1998).
  • Alfè, D., Price, G. D., Gillan, M. J., Phys. Rev. B: 64, 045123 (2001).
  • Kresse, G., Furthmüller, J. and Hafner, J., Europhys. Lett., 32: 729 (1995).
Toplam 52 adet kaynakça vardır.

Ayrıntılar

Birincil Dil İngilizce
Konular Mühendislik
Bölüm Physics
Yazarlar

Yasemin Çiftçi

A. Ergun Bu kişi benim

K. Colakoglu Bu kişi benim

E. Delıgoz Bu kişi benim

Yayımlanma Tarihi 28 Mart 2014
Yayımlandığı Sayı Yıl 2014 Cilt: 27 Sayı: 1

Kaynak Göster

APA Çiftçi, Y., Ergun, A., Colakoglu, K., Delıgoz, E. (2014). First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter. Gazi University Journal of Science, 27(1), 627-636.
AMA Çiftçi Y, Ergun A, Colakoglu K, Delıgoz E. First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter. Gazi University Journal of Science. Mart 2014;27(1):627-636.
Chicago Çiftçi, Yasemin, A. Ergun, K. Colakoglu, ve E. Delıgoz. “First Principles LDA+U and GGA+U Study of HfO2: Dependence on the Effective U Parameter”. Gazi University Journal of Science 27, sy. 1 (Mart 2014): 627-36.
EndNote Çiftçi Y, Ergun A, Colakoglu K, Delıgoz E (01 Mart 2014) First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter. Gazi University Journal of Science 27 1 627–636.
IEEE Y. Çiftçi, A. Ergun, K. Colakoglu, ve E. Delıgoz, “First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter”, Gazi University Journal of Science, c. 27, sy. 1, ss. 627–636, 2014.
ISNAD Çiftçi, Yasemin vd. “First Principles LDA+U and GGA+U Study of HfO2: Dependence on the Effective U Parameter”. Gazi University Journal of Science 27/1 (Mart 2014), 627-636.
JAMA Çiftçi Y, Ergun A, Colakoglu K, Delıgoz E. First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter. Gazi University Journal of Science. 2014;27:627–636.
MLA Çiftçi, Yasemin vd. “First Principles LDA+U and GGA+U Study of HfO2: Dependence on the Effective U Parameter”. Gazi University Journal of Science, c. 27, sy. 1, 2014, ss. 627-36.
Vancouver Çiftçi Y, Ergun A, Colakoglu K, Delıgoz E. First principles LDA+U and GGA+U study of HfO2: Dependence on the effective U parameter. Gazi University Journal of Science. 2014;27(1):627-36.