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Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique

Yıl 2020, Cilt: 4 Sayı: 1, 38 - 42, 30.06.2020

Seydi Doğan

https://doi.org/10.32571/ijct.704871
Cited By: 1

Öz

Nickel doped ZnO (NZO) and undoped ZnO thin films were deposited by wet chemical sol-gel spin coating method and their optical and structural properties have in detail been investigated by X-ray diffraction and optical absorption measurements to observe the effect of doping with different values of Ni molarity. The NZO and undoped ZnO thin films showed a growing trend along the c-axis perpendicular to the substrate surface. The strong (002) diffraction peaks at 2θ = 35.743°, 35.836°, 35.840° and 36.041° were observed to belong to samples undoped ZnO, NZO (0.25%), NZO (0.50%) and NZO (0.75%) films, respectively. The band gap values have been calculated from the dependencies (2 vs hν) by extrapolating the straight lines to 2 = 0 and found as 3.2630 eV and 3.2820 eV for 0.75% NZO and undoped ZnO thin films, respectively. 

Anahtar Kelimeler

Nickel doped ZnO sol-gel growth thin film

Destekleyen Kurum

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Proje Numarası

-

Teşekkür

-

Kaynakça

  • 1. Yan, Z.; Lei, G.; Meng, Li.; Mei, Y.; Shenguang, G.; Jinghua, Yu.; Xianrang, S.; Bingqiang, C. Chem. Commun. 2014, 50, 1417–1419.
  • 2. Pawar, B. N.; Ham, D.-H.; Mane, R. S.; Ganesh, T.; Cho, B. W.; Han, S. H.; Appl. Surf. Sci. 2008, 254, 6294-6297.
  • 3. Sanchez-Juarez, A.; Tiburcio-Silver, A.; Ortiz, A.; Zironi, E.P.; Rickards, J.; Thin Solid Films 1998, 333, 196-202.
  • 4. Huang, C.; Wang, M.; Deng, Z.; Cao, Y.; Liu, Q.; Huang, Z.; Liu, Y.; Guo, W.; Huang, Q.; J Mater. Sci: Mater. El. 2010, 21, 1221–1227.
  • 5. Maldonado, A.; Olvera, M. de la L.; Guerra, S. T.; Asomoza, R.; Sol. Energ. Mat. Sol. C. 2004, 82, 75–84.
  • 6. Huang, C.; Wang, M., Liu, Q., Cao, Y.; Deng, Z.; Huang, Z.; Liu, Y., Huang Q.; Guo, W., Semicond. Sci. Tech. 2009, 24, 095019.
  • 7. Zhu, J.; Zhang, H.; Zhu, Z.; Li, Q., Jin, G.; Opt. Commun. 2014, 322, 66–72.
  • 8. Duman, S.; Doğan, S.; Gürbulak, B., Türüt, M.; Appl. Phys. A- Mater. 2008, 91, 337–340.
  • 9. Chen, K.J.; Hung, F.Y.; Chang, S.J.; Hu, Z.S.; Appl. Surf. Sci. 2009, 255, 6308–6312.
  • 10. Sofiani, Z.; and Sahraoui, B.; J. Appl. Phys. 2007, 101, 063104.
  • 11. Choi, B.G.; Kim, I.H.; Kim, D.H.; Lee, K.S.; Lee, T.S.; Cheong, B.; Baik, Y.-J.; Kim, W.M.; J. Eur. Ceram. Soc. 2005, 25, 2161–2165.
  • 12. Maldonado, A.; Tirado-Guerra, S.; Cázares, J.M.; Olvera, M. de la L.; Thin Solid Films 2010, 518, 1815–1820.
  • 13. Zhang, K.; Zhu, F.; Huan, C. H. A.; Wee, A.T.S.; Osipowicz, T.; Surf. Interface Anal. 1999, 28, 271–274.
  • 14. Wen, Z. Z.; Zhong, H. L.; Qiu, Z. H.; Chang, S. J.; Ming, B. J.; Tong, S. K.; Xi, C.; Ze, Z. J.; Xue, L., Xia Z. J.; Chinese Phys. Lett. 2010, 27, 017301.
  • 15. Paraguay, F.D.¸ Morales, J.; Estrada, W.L.; Andrade, E.; Yoshida, M. M.; Thin Solid Films 2000, 366, 6-27.
  • 16. Kumar, P. M. R.; Kartha, C.S.; Vijayakumar, K.P.; Abe, T.; Kashiwaba, Y.; Singh F.; Avasthi, D. K.; Semicond. Sci. Tech. 2005, 20, 120–126.
  • 17. Machado, G.; Guerra, D.N.; Leinen, D.; Barrado, J.R.; Marotti, R.E.; Dalchiele, E.A.; Thin Solid Films 2005, 490, 124–131.
  • 18. Sakthivelu, A.; Saravanan, V.; Anusuya, M.; Prince, J. J.; J. Ovonic Res. 2011, 7 1-7.
  • 19. Arredondo, E. J. L.; Maldonado, A.; Asomoza, R.; Acosta, D. R.; Lira, M.A. M.; Olvera, M. de la L.; Thin Solid Film 2005, 490, 132 –136.
  • 20. Ilican, S.; Caglar, Y.; Caglar, M.; Yakuphanoglu, F.; Appl. Surf. Sci. 2008, 255, 2353–2359.
  • 21. Kim, K.T.; Kim, G. H.; Woo, J. C.; Kim, C.; Surf. Coat. Tech. 2008, 202, 5650-5653.
  • 22. Khan Z. ; Khan, M.; Zulfequar, M.; Khan, M. S.; Mater. Sci. Appl. 2011, 2(5), 340-345.
  • 23. Derbali, S.; Nouneh, K.; Galca, A. C.; Touhami, M. E.; Secu, M.; Matei, E.; Leonat, L. N.; Pintilie, L.; Harfaoui, N.; Fahoume, M.; Opt. Quant. Electron. 2019, 51, 210.
  • 24. Cao, L.; Zhu, L.; Jiang, J.; Zhao, R.; Ye, Z.; Zhao, B., Sol. Energ. Mat. Sol. C. 2011, 95, 894-898.
  • 25. Yakuphanoglu, F.; Caglar, Y.; Ilican, S.; Caglar, M.; Physica B. 2007, 394, 86–92.
  • 26. Hernandez, R. G.; Martinez, A. I.; Falcony, C.; Lopez, A. A.; Pech-Canul, M.I.; Hdz-Garcia, H. M.; Mater. Lett. 2010, 64, 1493–1495.
  • 27. Tauc, J. Amorphous and Liquid Semiconductors, Plenum Press, New York, 1974.

Yıl 2020, Cilt: 4 Sayı: 1, 38 - 42, 30.06.2020

Seydi Doğan

https://doi.org/10.32571/ijct.704871
Cited By: 1

Öz

Proje Numarası

-

Kaynakça

  • 1. Yan, Z.; Lei, G.; Meng, Li.; Mei, Y.; Shenguang, G.; Jinghua, Yu.; Xianrang, S.; Bingqiang, C. Chem. Commun. 2014, 50, 1417–1419.
  • 2. Pawar, B. N.; Ham, D.-H.; Mane, R. S.; Ganesh, T.; Cho, B. W.; Han, S. H.; Appl. Surf. Sci. 2008, 254, 6294-6297.
  • 3. Sanchez-Juarez, A.; Tiburcio-Silver, A.; Ortiz, A.; Zironi, E.P.; Rickards, J.; Thin Solid Films 1998, 333, 196-202.
  • 4. Huang, C.; Wang, M.; Deng, Z.; Cao, Y.; Liu, Q.; Huang, Z.; Liu, Y.; Guo, W.; Huang, Q.; J Mater. Sci: Mater. El. 2010, 21, 1221–1227.
  • 5. Maldonado, A.; Olvera, M. de la L.; Guerra, S. T.; Asomoza, R.; Sol. Energ. Mat. Sol. C. 2004, 82, 75–84.
  • 6. Huang, C.; Wang, M., Liu, Q., Cao, Y.; Deng, Z.; Huang, Z.; Liu, Y., Huang Q.; Guo, W., Semicond. Sci. Tech. 2009, 24, 095019.
  • 7. Zhu, J.; Zhang, H.; Zhu, Z.; Li, Q., Jin, G.; Opt. Commun. 2014, 322, 66–72.
  • 8. Duman, S.; Doğan, S.; Gürbulak, B., Türüt, M.; Appl. Phys. A- Mater. 2008, 91, 337–340.
  • 9. Chen, K.J.; Hung, F.Y.; Chang, S.J.; Hu, Z.S.; Appl. Surf. Sci. 2009, 255, 6308–6312.
  • 10. Sofiani, Z.; and Sahraoui, B.; J. Appl. Phys. 2007, 101, 063104.
  • 11. Choi, B.G.; Kim, I.H.; Kim, D.H.; Lee, K.S.; Lee, T.S.; Cheong, B.; Baik, Y.-J.; Kim, W.M.; J. Eur. Ceram. Soc. 2005, 25, 2161–2165.
  • 12. Maldonado, A.; Tirado-Guerra, S.; Cázares, J.M.; Olvera, M. de la L.; Thin Solid Films 2010, 518, 1815–1820.
  • 13. Zhang, K.; Zhu, F.; Huan, C. H. A.; Wee, A.T.S.; Osipowicz, T.; Surf. Interface Anal. 1999, 28, 271–274.
  • 14. Wen, Z. Z.; Zhong, H. L.; Qiu, Z. H.; Chang, S. J.; Ming, B. J.; Tong, S. K.; Xi, C.; Ze, Z. J.; Xue, L., Xia Z. J.; Chinese Phys. Lett. 2010, 27, 017301.
  • 15. Paraguay, F.D.¸ Morales, J.; Estrada, W.L.; Andrade, E.; Yoshida, M. M.; Thin Solid Films 2000, 366, 6-27.
  • 16. Kumar, P. M. R.; Kartha, C.S.; Vijayakumar, K.P.; Abe, T.; Kashiwaba, Y.; Singh F.; Avasthi, D. K.; Semicond. Sci. Tech. 2005, 20, 120–126.
  • 17. Machado, G.; Guerra, D.N.; Leinen, D.; Barrado, J.R.; Marotti, R.E.; Dalchiele, E.A.; Thin Solid Films 2005, 490, 124–131.
  • 18. Sakthivelu, A.; Saravanan, V.; Anusuya, M.; Prince, J. J.; J. Ovonic Res. 2011, 7 1-7.
  • 19. Arredondo, E. J. L.; Maldonado, A.; Asomoza, R.; Acosta, D. R.; Lira, M.A. M.; Olvera, M. de la L.; Thin Solid Film 2005, 490, 132 –136.
  • 20. Ilican, S.; Caglar, Y.; Caglar, M.; Yakuphanoglu, F.; Appl. Surf. Sci. 2008, 255, 2353–2359.
  • 21. Kim, K.T.; Kim, G. H.; Woo, J. C.; Kim, C.; Surf. Coat. Tech. 2008, 202, 5650-5653.
  • 22. Khan Z. ; Khan, M.; Zulfequar, M.; Khan, M. S.; Mater. Sci. Appl. 2011, 2(5), 340-345.
  • 23. Derbali, S.; Nouneh, K.; Galca, A. C.; Touhami, M. E.; Secu, M.; Matei, E.; Leonat, L. N.; Pintilie, L.; Harfaoui, N.; Fahoume, M.; Opt. Quant. Electron. 2019, 51, 210.
  • 24. Cao, L.; Zhu, L.; Jiang, J.; Zhao, R.; Ye, Z.; Zhao, B., Sol. Energ. Mat. Sol. C. 2011, 95, 894-898.
  • 25. Yakuphanoglu, F.; Caglar, Y.; Ilican, S.; Caglar, M.; Physica B. 2007, 394, 86–92.
  • 26. Hernandez, R. G.; Martinez, A. I.; Falcony, C.; Lopez, A. A.; Pech-Canul, M.I.; Hdz-Garcia, H. M.; Mater. Lett. 2010, 64, 1493–1495.
  • 27. Tauc, J. Amorphous and Liquid Semiconductors, Plenum Press, New York, 1974.
Toplam 27 adet kaynakça vardır.

Ayrıntılar

Birincil Dil İngilizce
Konular Metroloji,Uygulamalı ve Endüstriyel Fizik, Malzeme Üretim Teknolojileri
Bölüm Makale
Yazarlar

Seydi Doğan 0000-0001-9785-4990

Proje Numarası -
Yayımlanma Tarihi 30 Haziran 2020
Yayımlandığı Sayı Yıl 2020 Cilt: 4 Sayı: 1

Kaynak Göster

APA Doğan, S. (2020). Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique. International Journal of Chemistry and Technology, 4(1), 38-42. https://doi.org/10.32571/ijct.704871
AMA Doğan S. Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique. Int. J. Chem. Technol. Haziran 2020;4(1):38-42. doi:10.32571/ijct.704871
Chicago Doğan, Seydi. “Investigation of Structural and Optical Properties of ZnO Thin Films Deposited on Glass Substrates by Wet Chemical Sol-Gel Technique”. International Journal of Chemistry and Technology 4, sy. 1 (Haziran 2020): 38-42. https://doi.org/10.32571/ijct.704871.
EndNote Doğan S (01 Haziran 2020) Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique. International Journal of Chemistry and Technology 4 1 38–42.
IEEE S. Doğan, “Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique”, Int. J. Chem. Technol., c. 4, sy. 1, ss. 38–42, 2020, doi: 10.32571/ijct.704871.
ISNAD Doğan, Seydi. “Investigation of Structural and Optical Properties of ZnO Thin Films Deposited on Glass Substrates by Wet Chemical Sol-Gel Technique”. International Journal of Chemistry and Technology 4/1 (Haziran 2020), 38-42. https://doi.org/10.32571/ijct.704871.
JAMA Doğan S. Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique. Int. J. Chem. Technol. 2020;4:38–42.
MLA Doğan, Seydi. “Investigation of Structural and Optical Properties of ZnO Thin Films Deposited on Glass Substrates by Wet Chemical Sol-Gel Technique”. International Journal of Chemistry and Technology, c. 4, sy. 1, 2020, ss. 38-42, doi:10.32571/ijct.704871.
Vancouver Doğan S. Investigation of structural and optical properties of ZnO thin films deposited on glass substrates by wet chemical sol-gel technique. Int. J. Chem. Technol. 2020;4(1):38-42.

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