Kayalarda mikro çatlaklanma sürecine bağlı deformasyon evriminin sayısal analizi

Yıl 2023, Cilt: 44 Sayı: 2, 123 - 141, 24.08.2023

Şaziye Özge Dinç Göğüş , Elif Avşar , Kayhan Develi , Ayten Çalık

https://doi.org/10.17824/yerbilimleri.1209614

Öz

Gerilmeye maruz kalan bir kayanın yenilme ve deformasyon karakteri mikro ölçekteki çatlaklanma sürecine bağlıdır. Bu sürecin nasıl evrildiğinin anlaşılması konusunda farklı laboratuvar ve analitik yöntemler kullanılmaktadır. Bu çalışmada söz konusu yöntemlere bir alternatif olarak mikro çatlaklanma sürecinin sayısal modelleme tekniği ile tespit edilebilirliği araştırılmıştır. İgnimbirit, mermer ve diyabaz olmak üzere üç farklı kaya türü üzerinde yapılan laboratuvar deneylerinden elde edilen makro mekanik parametreler, ayrık elemanlar yöntemine (DEM) dayalı sayısal kaya modellerinin kalibrasyonunda kullanılmıştır. Sonuçlar incelendiğinde model tahminleri ile laboratuvar verilerinin uyumlu olduğu belirlenmiş ve bu durum sayısal çatlaklanma analizlerinin kaya ortamını temsil edecek şekilde yürütülebileceğini göstermiştir. Laboratuvar deneylerinin simülasyonlarında, sıkışma gerilmesi altındaki model örneklerinde mikro çatlaklanmanın başladığı (σci) ve ilerleyerek biriktiği (σcd) kritik eşik gerilme seviyeleri tespit edilmiştir. Bu gerilme seviyeleri sırasıyla ignimbirit için σci = 25 MPa ve σcd = 37 MPa; mermer için σci = 21 MPa ve σcd = 30 MPa ve diyabaz için σci = 38 MPa ve σcd = 55 MPa olarak belirlenmiştir. Tüm kaya modellerinde mikro çatlaklanma çekme mekanizması tarafından kontrol edilirken her üç kaya türü de kırılgan bir davranış sergilemektedir. Elde edilen tüm veriler, kayalardaki mikro çatlaklanma sürecinin araştırılmasında DEM tabanlı sayısal modelleme tekniğinin diğer yöntemlere alternatif olarak güvenli bir şekilde kullanılabileceğini göstermektedir.

Anahtar Kelimeler

Kaya deformasyonu, kritik gerilme eşik değeri, ayrık elemanlar yöntemi (DEM), mikro çatlaklanma.

Destekleyen Kurum

TÜBİTAK

Proje Numarası

121Y031

Kaynakça

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