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Muhammed Can Özdemir
Post Graduate
Publication
2
Review
0
CrossRef Cited
6
2
Publication
0
Review
6
CrossRef Cited
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Summary
Publications
Peer Review
Cited
Research Fields
Artificial Intelligence
Power Electronics
Control Theoryand Applications
Nanotechnology
Institution
Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
FAVORITE
0
TOTAL DOWNLOAD COUNT
1582
0
FAVORITE
1582
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
Articles published in
International Journal of Chemistry and Technology
Journal of the Institute of Science and Technology
User doesn't have any peer review duties on DergiPark.
Publications
The Effect of Measurement Frequency on Dielectric Characteristics in Al/P-Si Structures with Interfacial Native Oxide Layer
Authors:
Mehmet Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2020 ,
Journal of the Institute of Science and Technology
DOI: 10.21597/jist.612518
CITED
4
FAVORITE
0
TOTAL DOWNLOAD COUNT
1582
4
CITED
0
FAVORITE
1582
TOTAL DOWNLOAD COUNT
Effect of measurement frequency on admittance characteristics in Al/p-Si structures with interfacial native oxide layer
Authors:
Muhammed Can Özdemir
,
Ömer Sevgili
,
İkram Orak
,
Abdülmecit Türüt
Published: 2019 ,
International Journal of Chemistry and Technology
DOI: 10.32571/ijct.642886
CITED
2
FAVORITE
0
TOTAL DOWNLOAD COUNT
589
2
CITED
0
FAVORITE
589
TOTAL DOWNLOAD COUNT
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