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Nanotechnology

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It is not affiliated with an institution

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Developing A Novel Method for The Characterization of Semiconductor Devices by Provading Synchronous Operation of Lcr-Meters and Direct Current Sources by Using Real-Time Data Acquisition
Authors: Gülçin Ersöz Demir , İbrahim Yücedağ , Ercan Şahin , Yakup Bakış
Published: 2023 , Duzce University Journal of Science and Technology
DOI: 10.29130/dubited.1171603
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Duzce University Journal of Science and Technology
Duzce University Journal of Science and Technology
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